A New Type of Memory Test Aided Analysis Method

In order to solve the problem that the memory test data is mapped to specific failed cells with low efficiency and insufficient precision, this paper proposes a memory test-assisted analysis method. Firstly, the memory compiler will automatically generate the physical coordinate file of the storage array map after modifying it. Then the failure information of the storage unit is addressed in the generated coordinate file to find out the physical coordinates of the failure storage unit in the map. Finally, through the information of coordinate, the decoding information of the failed storage unit will be automatically output, as well as the physical coordinate two-dimensional image (of the failed storage unit) located in the entire storage array.